Characterisation of materials | Page up |
Laser modification of the electrical properties of vanadium oxide thin films | 131 |
Optical absorption and luminescence of LiTaO3:Cr and LiTaO3:Cr, Nd crystals | 145 |
Optical techniques used for in-situ studies of MBE growth processes | 181 |
Photoreflectance study of coupling effects in double quantum wells | 117 |
Study of Zn1-xMgxSe and Zn1-xBexSe semiconducting crystals by Raman scattering | 103 |
Reciprocal lattice mapping of InGaAs layers grown on InP(001) and GaAs(001) substrates | 107 |
Crystal growth | Page up |
Growth and optical properties of Nd:YVO4 laser crystals | 149 |
Fibre optics | Page up |
Analysis of working conditions of multimode fibre amplifiers | 197 |
Automatic fibre-optic sensor for oil detection | 203 |
Multilevel signalling in multimode fibre links | 209 |
Focal plane arrays | Page up |
Uncooled IR focal plane arrays | 253 |
Low-noise infrared and visible focal plane arrays | 259 |
Sharp infrared eyes: the journey of QWIPs from concept to large inexpensive arrays in hand-held infrared cameras | 271 |
Device physics and focal plane array applications of QWIP and MCT | 283 |
Low cost 320?240 uncooled IRFPA using conventional silicon IC process | 297 |
512?512 element GeSi/Si heterojunction infrared focal plane array | 305 |
A new type of dielectric bolometer mode of infrared detector using ferroelectric thin film capacitors for uncooled focal plane array | 313 |
Design and implementation of infrared readout circuit using a new input circuit of current mirroring direct injection (CMDI) | 321 |
MCT sensor readout devices with charge current injection and preliminary signal treatment. Testing procedure | 327 |
Growth of epitaxial layers | Page up |
Metalorganic vapour phase epitaxy of GaN and lateral overgrowth | 63 |
Surface strain during homoepitaxy: growth and ion ablation of CdTe | 75 |
Infrared detectors | Page up |
AlxGayIn1–x–yAs/InP-based quantum well infrared photodetectors | 1 |
A new type of dielectric bolometer mode of infrared detector using ferroelectric thin film capacitors for uncooled focal plane array | 313 |
Characteristics of infrared photodiode using SiO2 insulator on InSb wafer with p–i–n structure | 369 |
Device physics and focal plane array applications of QWIP and MCT | 283 |
GaAs homojunction interfacial workfunction internal photoemission (HIWIP) far-infrared detectors | 153 |
Novel electron mobility model for n–HgCdTe | 339 |
Novel InTlSb alloy for uncooled long-wavelength infrared photodetectors | 19 |
Numerical simulation for HgCdTe related detectors | 347 |
Sharp infrared eyes: the journey of QWIPs from concept to large inexpensive arrays in hand-held infrared cameras | 271 |
Studies of relationship between deep levels and RA product in mesa type HgCdTe devices | 361 |
Surface passivation of Hg0.8Cd0.2Te grown by MBE | 357 |
Uncooled IR focal plane arrays | 253 |
Image processing | Page up |
Simple video image segmentation system enabling real-time target tracking | 215 |
Non-linear optics | Page up |
On the nature of long-lived photoexcited states in polydiacetylenes: the photoinduced absorption spectra of PDA-4BCMU | 121 |
Optical properties of semiconductors | Page up |
Optical studies of MOVPE grown GaN layers | 93 |
Optical properties of Zn1–xMgxSe epilayers studied by reflection spectroscopy | 113 |
Photodiodes | Page up |
Gate-controlled narrow band gap photodiodes passivated with RF sputtered dielectrics | 97 |
Numerical simulation for HgCdTe related detectors | 347 |
Photoluminescence | Page up |
Photoluminescence and structural properties of selected wide-gap II-VI solid solutions | 87 |
Role of surface substances in excitation of porous silicon photoluminescence | 135 |
Quantum well systems | Page up |
Intersubband transitions in n-type quantum well systems | 81 |
Photoreflectance study of coupling effects in double quantum wells | 117 |
Semiconductor lasers | Page up |
Degradation process in II–VI-compounds-based electron-beam-pumped lasers and creation of material with uniquely high optical strength | 139 |
Recent advance in semiconductors mid-infrared lasers emitting at 3–12 um | 29 |